Company History

2004

IS-Test GmbH was founded in Mering (between Augsburg and Munich) as a qualified service provider for wafer probers

2005

Moved into larger facility in Munich. First trades of used wafer probers

2006

Became first address for probing applications

2007

1st IS-Test Workshop (ITWS) “Challenge or Nightmare”

2007

1st ONSITE cold upgrade qualified @ customer → became the 1st supplier on the market for ONSITE cold upgrade at 200 mm wafer probers (down to -40°C)

2008

2nd ITWS “Dirty talk about Probe Card Cleaning”. The ITWS in partnership with the Southwest Test Workshop (SWTW) in San Diego

2008

1st MOVABLE CHILLER & ONSITE cold upgrade qualified

2009

Benchmark winner for -45°C at 200mm wafer probers as ONSITE cold upgrade at NXP Semiconductors

2010

Entering the ASIAN market with ONSITE cold upgrades

2010

1st order received from NXP Semiconductors for -60°C at 300mm wafer probers as ONSITE cold upgrade

2011

Benchmark winner for -60°C at 300mm wafer probers as ONSITE cold upgrade at NXP Semiconductors

2011

3rd ITWS “Think in 3-D” – MEMS Test & “Probing @ The Limits”

2012

4th ITWS “Hot & Cold Wafer Probing – Challenge or Nightmare Part II” with over 60 participants

2013

5th ITWS Wafer Probing with about 60 participants from Germany, Austria, Italy and South Korea

2014

6th ITWS „MEMS Test & Probing @ The Limits“ with 98 participants from Europe and Asia

2015

7th ITWS „MEMS Probing & Probing @ The Limits – Round II“, again with close to 100 participants from Europe, Asia and the United States

2016

8th ITWS „Wafer Probing & Sensors – Vision or Nightmare?“, close to 80 participants from all over Europe, Asia, United States