2004
IS-Test GmbH was founded in Mering (between Augsburg and Munich) as a qualified service provider for wafer probers
2005
Moved into larger facility in Munich. First trades of used wafer probers
2006
Became first address for probing applications
2007
1st IS-Test Workshop (ITWS) “Challenge or Nightmare”
2007
1st ONSITE cold upgrade qualified @ customer → became the 1st supplier on the market for ONSITE cold upgrade at 200 mm wafer probers (down to -40°C)
2008
2nd ITWS “Dirty talk about Probe Card Cleaning”. The ITWS in partnership with the Southwest Test Workshop (SWTW) in San Diego
2008
1st MOVABLE CHILLER & ONSITE cold upgrade qualified
2009
Benchmark winner for -45°C at 200mm wafer probers as ONSITE cold upgrade at NXP Semiconductors
2010
Entering the ASIAN market with ONSITE cold upgrades
2010
1st order received from NXP Semiconductors for -60°C at 300mm wafer probers as ONSITE cold upgrade
2011
Benchmark winner for -60°C at 300mm wafer probers as ONSITE cold upgrade at NXP Semiconductors
2011
3rd ITWS “Think in 3-D” – MEMS Test & “Probing @ The Limits”
2012
4th ITWS “Hot & Cold Wafer Probing – Challenge or Nightmare Part II” with over 60 participants
2013
5th ITWS Wafer Probing with about 60 participants from Germany, Austria, Italy and South Korea
2014
6th ITWS „MEMS Test & Probing @ The Limits“ with 98 participants from Europe and Asia
2015
7th ITWS „MEMS Probing & Probing @ The Limits – Round II“, again with close to 100 participants from Europe, Asia and the United States
2016
8th ITWS „Wafer Probing & Sensors – Vision or Nightmare?“, close to 80 participants from all over Europe, Asia, United States