With its 6th edition, the IS-Test Workshop really went through the roof.

Almost 100 participants came together on May 12th & 13th to talk about MEMS test and probing at the limits, which were this year’s workshop outline. The hotel in Erding was hardly able to cope with this rush but did a nice job in the end – even though the staff had a hard time serving drinks in the late night, when the ITWS participants still sat together and enjoyed each other’s company.

All in all it seems like ITWS has become an important event in the semiconductor industry here in Europe after all. Being a forum where we can find new approaches to solving common problems together, socialize or simply keep in touch with each other, the IS-Test Workshop is a real gain.

The feedback that we received – verbally or via our workshop questionnaires – was superb and constructive. Everybody wants to join us again next year. We expect the number of participants to be even higher than this time. Of course we also got a lot of suggestions to improve ITWS. We will work ourselves through them and see what we can do!

Last but not least we want to say Thank You to everybody who made that great ITWS 6 possible – especially the speakers, but also each and everyone who did participate. Let’s look forward to ITWS 7 which is about to come – you can take it to the bank!

Download ITWS 6 agenda

Ranking of 6th ITWS Best Presentations – Participants’ Choice

1st Place: T.I.P.S. – Rainer Gaggl
2nd Place: BOSCH – Harald Berger
3rd Place: Infineon – Oliver Nagler & Martin Hennig