The 8th edition of the IS-Test Workshop on May 23rd and 24th, 2016 assured the position of ITWS as one of the most important recurring events of the semiconductor industry in Europe. After last year’s big success, the ITWS took place again at the NH Hotel Munich Airport where everything was set up for interesting discussions and pleasant small talks for close to 80 participants that made their way not only from Germany, Austria or Switzerland, but also from the Netherlands, the UK, the United States or Asia (e.g. Japan, Taiwan…).

The seven in-depth papers on topics such as „Typical “Pain Points” in Wafer Level Testing of Sensor SOCs“ (Johnstech International) or „A Probe Card Metrology Process Enabling Fast Feedback Loops“ (NanoFocus) gave detailed insights into problems, but also possible solutions in the field of Wafer Probing and Sensors. The workshop’s subtitle „Vision or Nightmare?“ was taken literally by our excellent Speakers who – sometimes – pointed out the „Nightmare“ , but nearly always also sketched out „Visions“ for smaller and bigger issues that are valuable for all our everyday work.

The big dinner in the evening of the first day was the perfect opportunity to chat with old friends and make new valuable contacts. Some of the workshop participants enjoyed the social aspect of ITWS late into the night.

The feedback that the ITWS workshop team received was overall very favourable and positive again. A trend can be seen whereby some of our regular workshop guests develop more and more of their own ideas to further improve IS-Test Workshop. We are very proud of and thankful for this development as it makes ITWS even more of a mutual, constructive event in everyone’s schedule. We thank everyone who provided their input, gave a Presentation or just took part at ITWS8, helping to make it one more success – see you next year for ITWS9!

Ranking of 8th ITWS Best Presentations – Participants’ Choice

1st Place: Johnstech International – Ranauld Perez
2nd Place: Aspect Systems – Marcus Verhoeven
3rd Place: NanoFocus – Martin Kunz