2007
1st IS-Test Workshop (ITWS) “Challenge or Nightmare”
2008
2nd ITWS “Dirty talk about Probe Card Cleaning”. The ITWS in partnership with the Southwest Test Workshop (SWTW) in San Diego
2011
3rd ITWS “Think in 3-D” – MEMS Test & “Probing @ The Limits”
2012
4th ITWS “Hot & Cold Wafer Probing – Challenge or Nightmare Part II” with over 60 participants
2013
5th ITWS Wafer Probing with about 60 participants from Germany, Austria, Italy and South Korea
2014
6th ITWS “MEMS Test & Probing @ The Limits” with 98 participants from Europe and Asia
2015
7th ITWS “MEMS Probing & Probing @ The Limits – Round II”, again with close to 100 participants from Europe, Asia and the United States
2016
8th ITWS “Wafer Probing & Sensors – Vision or Nightmare?”, close to 80 participants from all over Europe, Asia, United States
2017
9th ITWS “To Test or Not To Test – A closer look on wafer testing strategies”, 90 participants from Europe (e.g. Austria, Germany, Italy, Finland, France, Switzerland), Asia, USA
2018
ITWSX, 10th edition of IS-Test Workshop, close to 100 participants from Europe, Asia and the USA; First panel discussion at ITWS
2019
ITWS 11 at a new venue (Munich Airport Marriott Hotel); close to 100 participants from all over Europe and Asia; for the first time a Keynote Speaker opened ITWS; first time Poster Sessions in Coffee Breaks