ITWS History

2007

1st IS-Test Workshop (ITWS) “Challenge or Nightmare”

2008

2nd ITWS “Dirty talk about Probe Card Cleaning”. The ITWS in partnership with the Southwest Test Workshop (SWTW) in San Diego

2011

3rd ITWS “Think in 3-D” – MEMS Test & “Probing @ The Limits”

2012

4th ITWS “Hot & Cold Wafer Probing – Challenge or Nightmare Part II” with over 60 participants

2013

5th ITWS Wafer Probing with about 60 participants from Germany, Austria, Italy and South Korea

2014

6th ITWS “MEMS Test & Probing @ The Limits” with 98 participants from Europe and Asia

2015

7th ITWS “MEMS Probing & Probing @ The Limits – Round II”, again with close to 100 participants from Europe, Asia and the United States

2016

8th ITWS “Wafer Probing & Sensors – Vision or Nightmare?”, close to 80 participants from all over Europe, Asia, United States

2017

9th ITWS “To Test or Not To Test – A closer look on wafer testing strategies”, 90 participants from Europe (e.g. Austria, Germany, Italy, Finland, France, Switzerland), Asia, USA

2018

ITWSX, 10th edition of IS-Test Workshop, close to 100 participants from Europe, Asia and the USA; First panel discussion at ITWS

2019

ITWS 11 at a new venue (Munich Airport Marriott Hotel); close to 100 participants from all over Europe and Asia; for the first time a Keynote Speaker opened ITWS; first time Poster Sessions in Coffee Breaks